Thermal accumulation effect in three-dimensional recording by picosecond pulses

摘要

In-bulk recording without cracking in borosilicate glass by high repetition rate (80 MHz) 12 ps pulses at 355 nm wavelength is demonstrated and discussed. The theoretical model of a 'hot-line' scan and thermal accumulation qualitatively well describes the experimental results. The analytical expression of a thermally induced stress was obtained.